Detection and classification of heterogeneous materials as well as small particles using NIR-spectroscopy by validation of algorithms

Chen, Xiaozheng; Feil, Alexander (Corresponding author)

Karlsruhe : KIT Scientific Publishing (2019)
Contribution to a book, Contribution to a conference proceedings

In: OCM 2019 : 4th International Conference on Optical Characterization of Materials : March 13th - 14th, 2019 : Karlsruhe, Germany / edited by Jürgen Beyerer, Fernando Puente Léon, Thomas Längle
Page(s)/Article-Nr.: 63-77

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